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25/15/10 grids/vial for ultra fine mesh Pitch: Is 1"/mesh or 25
fits easily on light microscopes
Innovative experimental nanotech TEM supports
This type of sample holder is used to hold a flat sample
PELCO® Bar Clamp Vise, 4", 6" and 8" Dumont 25/15/10 grids/vial for ultra fineDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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