Low profile flat FIB pin mount Unit:pkg/10 boxes 2µm 1µm 500nm 200nm

boxes 2µm 1µm 500nm 200nm

VITA nTA Calibration Sample Set consisting of three polymer samples with known transition temperatures

15 and 20mm AFM/STM discs in a dust-free environment

Rapid source offset adjustment

Low profile flat FIB pin mount Unit:pkg/10 boxes 2µm 1µm 500nm 200nmDESCRIPTION These special low profile pin mounts are available as flat, as a 90 mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made out of aluminum. Fully compatible with standard pin stub mounts (pin 3. 2mm diameter) for sample storage and transport. These mounts can be used directly in FEI and TESCAN systems with the standard pin length and ZEISS LEO