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Optical Microscopy - transmitted
Porous specimens such as felt with a poor discharge path may accept a track of glue over its surface to reduce such static
This CD calibration test specimen comprises 5 line patterns
We highly recommend ordering the optional protective retainers for the MRS-4
Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration Optical Microscopy - transmittedDESCRIPTION These light weight tweezers and pliers are non absorbent, have a positive, gentle grip, are non magnetic and the tips do not open when extra pressure is applied. They resist acetone, alcohol and most acids. Static dissipative (carbon fiber reinforced) versions are available for most models. Ideal for sample preparation, microscopy, etching, electronics, instrumentation, laboratories, forensics and delicate wafer handling. Especially useful
